|
|
Home » News » industry information » Common failure modes and failure mechanisms of capacitors(2)

Common failure modes and failure mechanisms of capacitors(2)

Views: 5     Author: Site Editor     Publish Time: 2018-03-01      Origin: Site

    Main failure mechanism of capacitor breakdown.

    1.The dielectric material has blemishes or defects, or contains conductive impurities or conductive particles;

    2. Electrical aging and thermal aging of dielectric;

    3. Electrochemical reaction in dielectric;

    4. Silver ion migration;

    5. Mechanical damage to dielectric during capacitor manufacture;

    6. The change of molecular structure of dielectric;

    7. Interpolar arc in high humidity or low pressure environment;

    8. Transient short circuit of dielectric under mechanical stress.


Links

Contact Us

> Tel:86-562-2821018
> Fax:86-562-2821558
> Mob:86-13305620368
> Email:mpp@film-capacitor.com
> Address:NO.1771 QiFeng Road, Shizishan Economic Development Zone,Tongling, Anhui, China
Copyright  2017 Anhui Safe Electronics Co., LTD. All rights reserved. Sitemap      Log in to my mailbox