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Home » News » industry information » An In-depth Understanding of the Measurement of High Voltage Ceramic Chip Capacitor

An In-depth Understanding of the Measurement of High Voltage Ceramic Chip Capacitor

Views:0     Author:Site Editor     Publish Time: 2018-04-19      Origin:Site

The high-voltage ceramic chip capacitor has been accompanied by every kind of electronic product to everyone’s life. In the selection, when meeting the survey matter, what measures can be taken? Usual high-voltage ceramic chip capacitor measurement method is: put the multipurpose meter in the R* 10 file, The contact capacitor pin is divided by two table pens, and the resistance is usually measured in hundreds of k Ω to thousands of k Ω. If the resistance is very small or even zero, it indicates that the capacitor is short circuit.


When it is measured that the pointer of the multimeter cannot reach infinite data, the resistance value identified by the pointer is the leakage resistance of the capacitor of the high voltage ceramic chip. The farther the distance where the pointers is infinite is, the more critical the capacitor leakage of the high voltage ceramic chip is. Some capacitors in the measurement of its leakage resistance, the pointer back to the infinite direction, and then gradually swing clockwise direction, the more the number of swings indicates that the ceramic chip capacitance leakage current is more critical.


The short connection of high voltage ceramic chip capacitor is measured by omega file of multipurpose meter. If the contact capacitor pin is divided by two table pens, if the resistance measured by the pointer is very small or even zero, and the pointer cannot return to the infinite position, it indicates a short circuit in the capacitor. It is important to note that in capacitors with large measuring capacity, the appropriate range should be chosen according to the capacitor and the method explained above, otherwise, the charging of the high-voltage ceramic chip capacitor may be mistaken for electric breakdown.


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